Job Description
Job Description Our client is a leading developer of high throughput, modular phased arrays, and has developed electronically steerable antennas (ESAs), They are the No. 1 leading technology company developing high tech communications and radar technologies, and it is entering the growing satellite communication antenna market.
Increase your chances of an interview by reading the following overview of this role before making an application.
As a member of the hardware development team, the Senior IC Test Development Engineer will be responsible for developing test solutions to production screen The Clients RFICs to ensure that they meet the design specifications and quality requirements for the Client Phased Array Antenna products. Specifically:
• To work within the ASIC & Hardware test and design teams to develop screening and test solutions for The Client in-house designed custom Ku-Band/Ka-Band RF ASICs.
• To develop and improve test platforms to screen new silicon to ensure the ASIC meets its design specifications, testing the device digital functionality and RF circuits which includes LNAs and PAs up to 15GHz.
• To configure and commission the test platforms for new silicon reviewing screening thresholds against the new part performance and yields. Where it does not perform as expected to feedback any issues to the design teams.
• To develop additional screening tests for current and future silicon parts.
• Work closely with the ASIC, hardware and software design teams to ensure effective support of the development programme.
• Designing and documenting test requirements, plans and procedures, test results and equipment setups.
• To help transition the screening platforms into volume production working with the manufacturing team and external suppliers.
• The role may also include supporting the hardware team with design verification & testing of new board assemblies and production test methodologies
Organisational Responsibilities:
• Take responsibility for own projects and delivery to tight timescales, communicating through plans, presentations and written reports.
• Strongly self-motivated and able to take responsibility of problems and find effective solutions
• Ability to work independently and take responsibility to go and deliver effective test solutions.
• Ability to work with and influence the design teams to include design for test and manufacture ideas.
Qualifications & Skills: Essential:
• 3-6 years’ or more experience in a relevant industry job working on developing RFIC test solutions in the telecoms or data communications industry.
• Experience with volume production test solutions for RF semiconductor devices at package and die level in CMOS or SiGe technologies.
• Experience with National Instruments and Keysight Labview and TestStand applications and test equipment
• Understanding of IC production level qualification and process screening.
• A solid understanding of RF measurements and semiconductor device validation and characterisation.
• Strong programming and fault-finding skills for developing and debugging test programs.
• Competent with common piece of Lab Equipment – such as oscilloscopes, DVMs, RF power meter, spectrum analyser, VNAs, RF signal generators, Spectrum Analysers etc).
• Ability to capture requirements and translate them into written specifications.
Desirable:
• Analytical skills for development and debug of hardware and software when developing test solutions.
• Experience of schematic capture and PCB layout tools such as Altium designer or similar for development of new test boards.
• Expertise in Semiconductor Test Methodologies.
• Experience in digital test methodologies such as scan design and using scan vectors in a Labview environment
• Understanding/Experience of advanced IC packaging techniques
• Experience with wafer ATE test platforms such as: Advantest-93k, Teradyne-uFlex. Development of ATE solutions is a plus.
• Experience of test equipment solutions for either Automotive or Aerospace devices.
Job Reference 19003R7F
Location UK [United Kingdom] - London Central & City - London
Categorisation Post-Silicon / Manufacturing / Process : IC Test (ATE) Engineering